agilent N7782B per analyzer and n7783b thermal cycling unit data sheet introduction agilents N7782B series of polarization extinction ratio (per) analyzers has been designed for high speed and highly accurate testing of per in pm ? bers. the polarimetric measurement principle guarantees reliable measurements of per values of up to 50 db. the real time measurement capability in combination with automation interfaces makes this unit ideally suited for integration in manufacturing systems, for example pig-tailing stations for laser diodes and planar wave guide components. analog interfaces are provided for integration of the system in control loop applications. key bene? ts ? accurate per-measurement up to 50 db ? real-time display ? easy-to-use: reliable results independent of operator skill set ? swept-wavelength and heating/stretching method available ? measurement of the per versus wavelength ? fast/slow axis detection ? instruments available for 850 nm up to 1640 nm ? internal ? xed wavelength sources at 850 nm/1310 nm/1550 nm available.
2 agilent n7 782b per analyzer a nd n7783b thermal cycling unit data sheet applications laser diode pmf pig-tailing alignment of the pm ? ber during the pig-tailing process is supported by real-time display of the per and the optical power. pmf splicing in order to support the alignment during the splicing pro- cess of pm ? bers the agilent N7782B provides real time display of the optical power and of the angular misalign- ment of the two ? bers. pm component characterization measurement of the per on pm components like ? ber polarizers, pmf couplers, pmf splitters, etc. laser diode pmf control N7782B per analyzer n7783b thermal cycling unit N7782B and n7783b application examples figure 1. laser diode pigtailing using the combination of N7782B and n7783b. figure 2. characterization of pmf cross-coupling polarization crosstalk in a pm ? ber is measured and dis- played as per. pm splice characterization the angular misalignment of a pm splice can be measured in a non-destructive way. even multiple splices in a chain can be characterized independently. using agilents tunable laser source 81600b series in com- bination with the N7782B per analyzer allows measuring the per as a function of wavelength. agilents software package includes drivers for most of the tunable laser sources commonly used in industry. the heating / stretching method the heating / stretching method provides accurate mea- surements of the per at a single wavelength. this method supports in particular well the measurement using narrow-band laser sources. an optional internal laser source allows stand-alone opera- tion of the system. agilents thermal cycling unit, n7783b, is fully controlled by the N7782B per analyzer and allows accurate and repeat- able cycling of the temperature of the ? ber under test. the per measurement system consisting of the N7782B and the n7783b shows excellent accuracy and repeatability. ease of use and automation interfaces, such as analog output ports for active alignment, make it particularly useful for production environments. ref. per = 15.33 db live per = 31.68 db p = 7.23 dbm
3 agilent n7 782b per analyzer a nd n7783b thermal cycling unit data sheet splice angle characterization for characterizing an optical connection between two polarization maintaining ? bers (pmfs), such as an optical splice, two thermal cycling units (n7783b) can be used. this eliminates the in? uence of input polarization or subsequent ? bers at the output and isolates the angular misalignment of the connection located between the two thermal cycling units. figure 3. table 1: speci? cations a) N7782B per analyzer wavelength speci? cation wavelength range 1270 nm 1375 nm (opt 300, o-band) 1270 nm 1375 nm, 1460 nm 1620 nm (opt 400, o/c/l-band) 1460 nm 1620 nm (opt 500, c/l-band) operating wavelength range b) 1260 nm ... 1640 nm per analysis per range [c,d] 0 50 db per uncertainty, single-tcu method [c,d] (typical) per= 0 db ... 30 db: 0.30 db per= 30 db 50 db: 0.60 db splice angle analysis splice angle uncertainty, dual-tcu method [c,d] (typical) (0.1 + 4% - angle) optical power input power range -50 dbm ... +7 dbm internal laser source wavelength o-band (opt. 401): 1290 nm 1360 nm, 1310 nm typ. c-band (opt. 501, 401): 1510 nm 1580 nm, 1550 nm typ. output power [e] (typical) o-band (opt. 401): -12 dbm c-band (opt. 501, 401): -10 dbm [a] ambient temperature change max. 0.5c since normalization. speci? cation valid on day of calibration. [b] per measurements are possible outside the speci? cation wavelength range if the user performs a manual calibration. note that a fully polarized light source is needed for calibration. [c] input power > -30 dbm [d] narrow-band light source with dop > 95% needed. [e] at room temperature.
4 agilent n7 782b per analyzer a nd n7783b thermal cycling unit data sheet table 2: speci? cations a) N7782B-101 per analyzer wavelength speci? cation wavelength [e] 850 nm nominal operating wavelength range 2) 830 nm ... 1000 nm per analysis per range [c,d] 0 ... 40 db per uncertainty, single-tcu method [c,d] (typical) per= 0 db ... 30 db: 0.30 db per= 30 db 40 db: 0.60 db splice angle analysis splice angle uncertainty, dual-tcu method [c,d] (typical) (0.1 + 5% angle) optical power input power range -35 dbm ... +10 dbm internal laser source wavelength 830 nm ... 880 nm, 850 nm typ. output power [f] (typical) - 11 dbm [a] ambient temperature change max. 0.5c since normalization. speci? cation valid on day of calibration. [b] per measurements are possible outside the speci? cation wavelength range if the user performs a manual calibration note that a fully polarized light source is needed for calibration. [c] input power > -20 dbm [d] narrow-band light source with dop > 95% needed. [e] the speci? cation wavelength matches the wavelength of the internal laser source. [f] at room temperature. table 3: speci? cations a) n7783b thermal cycling unit temperature minimum peak-to-peak temperature tuning range [b] 50 k ambient temperature range 20c ... 30c [a] ambient temperature change max. 0.5c since normalization. speci? cation valid on day of calibration. [b] measured on the surface of the tec elements.
5 agilent n7 782b per analyzer a nd n7783b thermal cycling unit data sheet
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